Rofi'i, I. (2006). Determination OF Germanium Profile On Ion Implated GaAs Using Secondary Ion Mass Spectrometry: Jurnal Transistor Publikasi Ilmiah Teknologi Industri. Fakultas Teknik Industri UNISSULA.
Chicago Style CitationRofi'i, Imam. Determination OF Germanium Profile On Ion Implated GaAs Using Secondary Ion Mass Spectrometry: Jurnal Transistor Publikasi Ilmiah Teknologi Industri. Fakultas Teknik Industri UNISSULA, 2006.
MLA CitationRofi'i, Imam. Determination OF Germanium Profile On Ion Implated GaAs Using Secondary Ion Mass Spectrometry: Jurnal Transistor Publikasi Ilmiah Teknologi Industri. Fakultas Teknik Industri UNISSULA, 2006.
Warning: These citations may not always be 100% accurate.