APA Citation

Rofi'i, I. (2005). Investigations Of Germanium And Damage Profiles On Channeling Implanted SI-GaAs Using Rutherford Bacscattering Channeling Spectrometry: Jurnal Transistor Publikasi Ilmiah Teknologi Industri. Fakultas Teknik Industri UNISSULA.

Chicago Style Citation

Rofi'i, Imam. Investigations Of Germanium And Damage Profiles On Channeling Implanted SI-GaAs Using Rutherford Bacscattering Channeling Spectrometry: Jurnal Transistor Publikasi Ilmiah Teknologi Industri. Fakultas Teknik Industri UNISSULA, 2005.

MLA Citation

Rofi'i, Imam. Investigations Of Germanium And Damage Profiles On Channeling Implanted SI-GaAs Using Rutherford Bacscattering Channeling Spectrometry: Jurnal Transistor Publikasi Ilmiah Teknologi Industri. Fakultas Teknik Industri UNISSULA, 2005.